Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
A comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers.
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
товар №: 4679890

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

86% of respondents would recommend this to a friend

товар №: 4679890

TJS 997

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A comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers.
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What Stands Out

Comprehensive Coverage
This edition offers extensive insights into both Electron Microprobe Analysis and Scanning Electron Microscopy techniques, making it an invaluable resource for geologists seeking to enhance their analytical skills and techniques.
Practical Applications
It emphasizes practical applications of SEM and EMP in geology, addressing real-world challenges and providing solutions, which helps professionals improve their research and analysis capabilities effectively.
Updated Techniques
Incorporating the latest advancements in technology and methodologies, this book equips readers with current knowledge, ensuring they stay competitive and informed in the evolving field of geological analysis.

Информация о продукте

Shop Electron Microprobe Analysis and Scanning Electron Microscopy in Geology online at a best price in Tajikistan. 052114230X
  • Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Publisher Cambridge University Press
Publication date June 10, 2010
Edition 2nd
Language English
Print length 212 pages
ISBN-10 052114230X
ISBN-13 978-0521142304
Item Weight 12 ounces (340.2 grams)
Dimensions 6.69 x 0.48 x 9.61 inches (17 x 1.2 x 24.4 cm)

Who Should Buy?

Suitable For
  • Geology Students

    Ideal for geology students seeking comprehensive knowledge on electron microprobe analysis and scanning electron microscopy techniques.

  • Research Professionals

    Beneficial for researchers focusing on mineralogy, petrology, and materials science utilizing advanced imaging and analytical techniques.

  • Laboratory Technicians

    A useful resource for laboratory technicians who operate electron and scanning electron microscopes in geological studies.

Not Suitable For
  • Casual Readers

    May not appeal to casual readers seeking easily digestible content rather than in-depth technical material.

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Geology Editorial Review

**** The second edition of "Electron Microprobe Analysis and Scanning Electron Microscopy in Geology" has been well received by readers, particularly those in the geological sciences. Its primary strength lies in its ability to provide a clear and concise overview of Scanning Electron Microscopy (SEM) and electron microprobe techniques. Reviewers appreciate that while the book could delve deeper into the physics underpinning these methods, it remains focused on their diverse geological applications. This makes it a practical resource for both students and professional geologists alike, who may require an accessible introduction to these analytical tools without becoming overwhelmed by overly technical content. Readers have noted its readability and thoroughness, often mentioning how it effectively meets their specific needs in the field. The book is touted as an excellent overview, highlighting its functionality as a useful reference in practical settings. Some users have pointed out that it serves well as an introductory text and provides adequate background knowledge for practical application. This blend of clarity and relevance seems to resonate particularly well within the geology community, as reflected in the positive reception from those who have purchased and used the book. **

Customer Reviews & Ratings

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  • 5 звезда
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Плюсы

  • Concise overview of SEM and microprobe techniques.
  • Focused on geological applications, making it practical for geologists.
  • Well-structured and easily readable.
  • Provides sufficient background without overwhelming technicality.

Минусы

  • Lacks in-depth exploration of the physics behind SEM and microprobe methods.

Product Price History

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Особенности и преимущества

  • Covers electron microprobe analysis (EMPA) and scanning electron microscopy (SEM).
  • Focuses on geological applications and perspectives.
  • Discusses essential techniques and principles clearly.
  • Emphasizes practical aspects like sample preparation and result treatment.
  • Accessible for postgraduate researchers and industrial lab professionals.
  • Avoids unnecessary technical jargon.

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